De Angelis, S. et al. Three dimensional characterization of nickel coarsening in solid oxide cells via ex-situ ptychographic nano-tomography. Journal of Power Sources 383, 72–79 (2018).(Link)
De Angelis, S. et al. Ex-situ tracking solid oxide cell electrode microstructural evolution in a redox cycle by high resolution ptychographic nanotomography. Journal of Power Sources 360, 520–527 (2017). (Link)
Improvement to UNet and UNet++: UNet+3
Here, a new UNet structure is proposed. It is compared to UNet and UNet++ using Vgg16 and ResNet-101 as backbone. GitHub Repo
https://www.v7labs.com/blog/cross-entropy-loss-guide
Understanding Dice Loss for Crisp Boundary Detection
Accuracy
Pixelwise accuracy 3rd metric ()
IOU metric (different importance to clases, relative importance according to classes can give imporant to small details)I
Why is it important in our specific case
this might be better for our model because